FAILURE CAUSE DIAGNOSIS SYSTEM AND METHOD

专利名称：FAILURE CAUSE DIAGNOSIS SYSTEM AND

METHOD

发明人：Hiroki Uchiyama,Shinya Yuda,Hideaki

Suzuki,Kozo Nakamura

申请号：US13578034申请日：20100226

公开号：US20120310597A1公开日：20121206

专利附图：

摘要：Conditional base maintenance has been gaining widespread acceptance, withnumerous sensors attached to equipment for constant monitoring of its operational

state, the resulting sensor data being compared with those about the equipment in thenormal state for a diagnosis to determine whether the equipment is currently operatingnormally, the result of the diagnosis being used to conduct maintenance. Conditionalbase maintenance can rapidly detect aging deterioration of the equipment, so thatabnormal sates that were not detected before in time base maintenance can now bedetected. However, although conventional diagnosis technology can distinguish betweenthe normal state and anomaly, it has been difficult with such technology to identifycauses including abnormal phenomena and parts. If it is determined that the targetequipment to be diagnosed deviates from the normal state, the degree of deviation ofeach parameter from the normal state as the reference is calculated as an abnormalcontribution ratio. A failure cause is estimated from a similarity ratio between the

calculated abnormal contribution ratio and the abnormal contribution ratio of each of thefailure causes collected in the past and including failure phenomena and failure parts.

申请人：Hiroki Uchiyama,Shinya Yuda,Hideaki Suzuki,Kozo Nakamura

地址：Kawasaki JP,Hitachi JP,Hitachi JP,Hitachiota JP

国籍：JP,JP,JP,JP

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