Time-of-flight analyzer and method

专利名称：Time-of-flight analyzer and method发明人：Marvin L. Vestal申请号：US07/782112申请日：19911025公开号：US05160840A公开日：19921103

摘要：A time-of-flight mass spectrometry and method of operating a TOF massspectrometer are disclosed. The mass spectrometer includes one or more electricallycharged accelerating plates for accelerating ions, a reflector, a first ion drift regionupstream from the reflector, a second ion drift region downstream from the deflector,and an ion detector. The ion reflector includes a primary reflecting field for deceleratingions and reflecting low energy ions, and a second reflecting field for reflecting highenergy ions and for establishing a substantially uniform ion flight time through the oneor more accelerating fields and reflecting fields. According to the method of the presentinvention, the length of the ion drift regions may be adjusted such that ion travel timethrough these regions is equal to the ion travel time through the accelerating andreflecting fields. The second reflecting field downstream from the primary electrical fieldis adjusted such that high energy ions spend additional time in the second reflecting fieldcompared to low energy ions to compensate for the shorter time high energy ions spendin the accelerating field and drift-free regions. The concepts of the present invention maybe used with various techniques for producing ions, and ions may be formed in pulses byselectively activating a laser source, or formed in an ion beam pulsed toward thereflector by selectively activating the one or more of the accelerated fields.

申请人：VESTAL; MARVIN L.

代理机构：Browning, Bushman, Anderson & Brookhart

更多信息请下载全文后查看