专利名称：Method and apparatus for measuring MU-MIMO interference in mobile communicationsystem
发明人：Youn Sun Kim,Ju Ho Lee,Hyo Jin Lee,Yong
Jun Kwak,Young Bum Kim,Hyoung Ju Ji
申请号：US14328612申请日：20140710公开号：US10014976B2公开日：20180703
专利附图：
摘要：One or more embodiments discloses a method of measuring interference by an
evolved NodeB and an eNB device. The method includes configuring one or more firsttype interference measurement resources in a User Equipment (UE). The method alsoincludes transmitting signals for a plurality of UEs within a cell range of the eNB to theone or more first type interference measurement resources. The method also includesreceiving channel status information generated in accordance with a signal received in theone or more first type interference measurement resources.
申请人：Samsung Electronics Co., Ltd.
地址：Gyeonggi-do KR
国籍：KR
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