专利名称：Capacitance probe for detection of
anomalies in non-metallic plastic pipe
发明人：Mahendra P. Mathur,James L.
Spenik,Christopher M. Condon,RodneyAnderson,Daniel J. Driscoll,William L.Fincham, Jr.,Esmail R. Monazam
申请号：US12844986申请日：20100728公开号：US07839282B1公开日：20101123
专利附图：
摘要：The disclosure relates to analysis of materials using a capacitive sensor todetect anomalies through comparison of measured capacitances. The capacitive sensor isused in conjunction with a capacitance measurement device, a location device, and aprocessor in order to generate a capacitance versus location output which may beinspected for the detection and localization of anomalies within the material under test.The components may be carried as payload on an inspection vehicle which may traversethrough a pipe interior, allowing evaluation of nonmetallic or plastic pipes when thepiping exterior is not accessible. In an embodiment, supporting components are solid-state devices powered by a low voltage on-board power supply, providing for use inenvironments where voltage levels may be restricted.
申请人：Mahendra P. Mathur,James L. Spenik,Christopher M. Condon,RodneyAnderson,Daniel J. Driscoll,William L. Fincham, Jr.,Esmail R. Monazam
地址：Pittsburgh PA US,Morgantown WV US,Morgantown WV US,Grafton WVUS,Morgantown WV US,Fairmont WV US,Morgantown WV US
国籍：US,US,US,US,US,US,US
代理人：James B. Potts,Mark P. Dvorscak
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